Structural analysis of 'SI''O IND.2' gel films by high energy electron difraction (1994)
Source: Journal of Sol-Gel Science and Technology. Unidade: IFSC
Assunto: FÍSICA
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OHSAKI, H et al. Structural analysis of 'SI''O IND.2' gel films by high energy electron difraction. Journal of Sol-Gel Science and Technology, v. 2 , p. 245-9, 1994Tradução . . Acesso em: 19 maio 2024.APA
Ohsaki, H., Miura, K., Imai, A., Tada, M., & Aegerter, M. A. (1994). Structural analysis of 'SI''O IND.2' gel films by high energy electron difraction. Journal of Sol-Gel Science and Technology, 2 , 245-9.NLM
Ohsaki H, Miura K, Imai A, Tada M, Aegerter MA. Structural analysis of 'SI''O IND.2' gel films by high energy electron difraction. Journal of Sol-Gel Science and Technology. 1994 ;2 245-9.[citado 2024 maio 19 ]Vancouver
Ohsaki H, Miura K, Imai A, Tada M, Aegerter MA. Structural analysis of 'SI''O IND.2' gel films by high energy electron difraction. Journal of Sol-Gel Science and Technology. 1994 ;2 245-9.[citado 2024 maio 19 ]
